In the present work, a simple laser/detector-based system was assembled and mounted in situ at the production line of the Hitachi hard-disk recording-head facilities in Mexico. The system was set to scan the surface of rotating lapping plates charged during time windows of varying lengths. The specular-reflection component was measured as a function of angular distance along the plate surface. The optical system showed enough sensitivity to follow the incorporation of abrasive into the plate surface. Moreover, two different charging stages were identified. Relevant topographical information could also be extracted. For example, the data distribution skewness was used to identify major surface defects, such as scratches. The reflection-signal spatial pattern was matched to that of the lapping plate topographer (LPT) surface profile by means of a coherence-spectrum analysis. The system assembly is relatively straightforward and it occupies little space. Thus, it could become a compact multitask substitute or complement of larger equipment at the manufacturing line. Note that even when the data analysis performed has led to promising results, the technique still needs to be fine-tuned in order to increase its precision and reliability.

References

1.
Gatzen
,
H. H.
, and
Maetzig
,
J. C.
,
1997
, “
Nanogrinding
,”
Precis. Eng.
,
21
(
2–3
), pp.
134
139
.
2.
Vurens
,
G. H.
, and
Khazeni
,
K.
,
2007
, “
Reflectance Surface Analyzer
,” U.S. Patent No. 7,206,066 B2.
3.
Vurens
,
G. H.
,
Klein
,
D. L.
,
Gan
,
W.
, and
Ultican
,
T.
,
2000
, “
Tribology Applications of Surface Reflectance Analyzers: Optical Characterization of the Head Disk Interface
,”
Tribol. Int.
,
33
(
9
), pp.
647
653
.
4.
Belden
,
L. H.
, Jr.
,
1979
, “
Optical Method and Apparatus for Surface Roughness Evaluation
,” U.S. Patent No. 4,146,330 A.
5.
Moran
,
K. E.
,
1995
, “
Particle Detection System With Reflective Line-to-Spot Collector
,” U.S. Patent No. 5,448,364 A.
6.
Klein
,
D.
, and
Vurens
,
G. H.
,
1999
, “
Measurements of Thin Film Disks by Surface Reflectance Analysis
,”
SPIE Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
, J. C. Stover, ed., Vol.
3619
, San José, CA, pp. 18–26.
7.
Arney
,
J.
,
Michel
,
J.
, and
Pollmeier
,
K.
,
2002
, “
Technique for Analysis of Surface Topography of Photographic Prints by Spatial Analysis of First Surface Reflectance
,”
J. Imaging Sci. Technol.
,
46
(
4
), pp.
350
358
.
8.
Lilienfeld
,
P.
,
1986
, “
Optical Detection of Particle Contamination on Surfaces: A Review
,”
Aerosol Sci. Technol.
,
5
(
2
), pp.
145
165
.
9.
Golnabi
,
H.
,
2001
, “
Diffuse Reflectance Measurements From Different Surfaces
,”
J. Sci. Islamic Repub. Iran
,
12
(
4
), pp.
359
364
.
10.
NIST/SEMATECH
,
2015
, “
Engineering Statistics: e-Handbook of Statistical Methods
,” National Institute of Standards and Technology, Gaithersburg, MD, http://www.itl.nist.gov/div898/handbook/
11.
Heinzel
,
G.
,
Rüdiger
,
A.
, and
Schilling
,
R.
,
2002
, “
Spectrum and Spectral Density Estimation by the Discrete Fourier Transform (DFT), Including a Comprehensive List of Window Functions and Some New at-Top Windows
,” Max-Planck-Institut für Gravitationsphysik, The Max Planck Society, Munich, Germany, http://hdl.handle.net/11858/00-001M-0000-0013-557A-5
12.
Warner
,
R. M.
,
1998
,
Spectral Analysis of Time-Series Data
,
The Guilford Press
,
New York
, pp.
143
145
.
13.
Mayén-Mondragón
,
R.
,
Yáñez-Limón
,
J. M.
,
Espinoza-Beltrán
,
F. J.
,
Muñoz-Saldaña
,
J.
,
Ramírez-Bon
,
R.
,
Montero-Camacho
,
O.
, and
Rocha-Gallardo
,
H.
,
2008
, “
Statistical Characterization of the Lapping Plate Surface Morphology Evolution in a Diamond Charging Process
,”
Meas. Sci. Technol.
,
19
(
6
), p.
065706
.
14.
Mayén-Mondragón
,
R.
,
Yánez-Limón
,
J. M.
,
Espinoza-Beltrán
,
F.
,
Muñoz-Saldaña
,
J.
,
Herrera-Gómez
,
A.
,
Vargas-Ortíz
,
R. A.
,
Ramírez-Bon
,
R.
, and
Coronado
,
F.
,
2012
, “
Following the Integration of Diamond Particles on the Lapping-Plate Surface: Towards a More Efficient Charging Process
,”
ASME J. Tribol.
,
134
(
4
), p.
042301
.
You do not currently have access to this content.