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Proceedings Papers

Non-Smooth Dynamics of Tapping Mode Atomic Force Microscopy

Pierpaolo Belardinelli, Abhilash Chandrashekar, Farbod Alijani, Stefano Lenci
Proc. ASME. IDETC-CIE2022, Volume 9: 18th International Conference on Multibody Systems, Nonlinear Dynamics, and Control (MSNDC), V009T09A006, August 14–17, 2022
Paper No: DETC2022-88005
DOI: https://doi.org/10.1115/DETC2022-88005
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Topics: Atomic force microscopy, Non-smooth dynamics, Bifurcation, Energy dissipation, Nonlinear dynamics, Robustness
Proceedings Papers

Getting Beyond the Hairy House: Using Structure-Function-Mechanism to Advance Biologically Inspired Design Pedagogy

Michael E. Helms, Hoda Ehsan, Euisun Kim, Roxanne Moore, Meltem Alemdar, Christopher J. Cappelli, Jeff Rosen, Marc Weissburg
Proc. ASME. IDETC-CIE2021, Volume 6: 33rd International Conference on Design Theory and Methodology (DTM), V006T06A018, August 17–19, 2021
Paper No: DETC2021-71721
DOI: https://doi.org/10.1115/DETC2021-71721
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Topics: Design, Engineering teachers, Atomic force microscopy, Design engineering, Education, Engineering education, Undergraduate students
Proceedings Papers

Approximate Real-Time Force Spectroscopy Within Amplitude-Modulation Atomic Force Microscopy Topographical Imaging Using Few Harmonics and Fourier Methods

Berkin Uluutku, Santiago D. Solares
Proc. ASME. IDETC-CIE2021, Volume 11: 15th International Conference on Micro- and Nanosystems (MNS), V011T11A006, August 17–19, 2021
Paper No: DETC2021-67205
DOI: https://doi.org/10.1115/DETC2021-67205
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Topics: Atomic force microscopy, Fourier analysis, Imaging, Spectroscopy
Proceedings Papers

Surface Functionalization of Silicon MEMS Biochemical Sensors for the Detection of Foodborne Pathogens

Md Ebrahim Khalil Bhuiyan, Dustin Smith, Eric J. Voss, Chin-Chuan Wei, Mohammad Shavezipur
Proc. ASME. IDETC-CIE2021, Volume 11: 15th International Conference on Micro- and Nanosystems (MNS), V011T11A003, August 17–19, 2021
Paper No: DETC2021-69708
DOI: https://doi.org/10.1115/DETC2021-69708
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Topics: Biosensors, DNA, Microelectromechanical systems, Self-assembly, Sensors, Silicon, Atomic force microscopy, Bacteria, Biological agents, Coating processes
Proceedings Papers

Wavelet Analysis for Assessment of Localized Spectral Variations in Surface Topographic Data

Vivek G. Badami, Susan S. Hefner, Stuart T. Smith
Proc. ASME. DETC95, Volume 3A: 15th Biennial Conference on Mechanical Vibration and Noise — Vibration of Nonlinear, Random, and Time-Varying Systems, 1381-1385, September 17–20, 1995
Paper No: DETC1995-0385
DOI: https://doi.org/10.1115/DETC1995-0385
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Topics: Wavelets, Calibration, Atomic force microscopy, Fourier transforms, Microscopes, Wavelet transforms
Proceedings Papers

XYZ-Stage for Scanning Probe Microscope by Using Parallel Mechanism

Koshiro Yamakawa, Katsushi Furutani, Naotake Mohri
Proc. ASME. DETC99, Volume 6: International Symposium on Motion and Vibration Control, 37-42, September 12–16, 1999
Paper No: DETC99/MOVIC-8425
DOI: https://doi.org/10.1115/DETC99/MOVIC-8425
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Topics: Atomic force microscopy, Feedback, Parallel mechanisms, Scanning probe microscopy, Engineering prototypes, Displacement, Degrees of freedom, Diffraction gratings, Errors, Resonance
Proceedings Papers

Excimer Laser Treatment of Steel Fibers for Improved Adhesion to Silicone Rubber

Erol Sancaktar, Xiaoxiao Liu
Proc. ASME. IDETC-CIE2020, Volume 5: 24th Reliability, Stress Analysis, and Failure Prevention Conference (RSAFP), V005T05A001, August 17–19, 2020
Paper No: DETC2020-22194
DOI: https://doi.org/10.1115/DETC2020-22194
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Topics: Adhesion, Excimer lasers, Fibers, Silicone rubber, Steel, Bonding, Atomic force microscopy, Elastomers, Lasers, Rubber
Proceedings Papers

Stochastic Switching and Reduction of Integrity in Atomic Force Microscopy

Pierpaolo Belardinelli, Stefano Lenci, Farbod Alijani
Proc. ASME. IDETC-CIE2018, Volume 8: 30th Conference on Mechanical Vibration and Noise, V008T10A018, August 26–29, 2018
Paper No: DETC2018-85421
DOI: https://doi.org/10.1115/DETC2018-85421
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Topics: Atomic force microscopy, Noise (Sound), Stability, Dynamics (Mechanics), Erosion, Excitation, Imaging, Probes, Resonance, Spectroscopy
Proceedings Papers

Empirical Mode Decomposition for Dynamic AFM Microcantilevers in Air and Liquid Environment

Il Kwang Kim, Jea Woong Jang, Soo Il Lee
Proc. ASME. IDETC-CIE2018, Volume 4: 23rd Design for Manufacturing and the Life Cycle Conference; 12th International Conference on Micro- and Nanosystems, V004T08A012, August 26–29, 2018
Paper No: DETC2018-86215
DOI: https://doi.org/10.1115/DETC2018-86215
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Topics: Atomic force microscopy, Microcantilevers, Damping, Dynamics (Mechanics), Principal component analysis
Proceedings Papers

Torsional Tip Motion of Double Beam Atomic Force Microscopy

John O’Donnell, Anahita Zargarani, S. Nima Mahmoodi
Proc. ASME. IDETC-CIE2018, Volume 4: 23rd Design for Manufacturing and the Life Cycle Conference; 12th International Conference on Micro- and Nanosystems, V004T08A008, August 26–29, 2018
Paper No: DETC2018-85411
DOI: https://doi.org/10.1115/DETC2018-85411
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Topics: Atomic force microscopy, Boundary-value problems, Design, Galerkin method, Geometry, Piezoelectric actuators, Vibration
Proceedings Papers

Prototyping Electrostatic Scanning Force Microscope

Hamidreza Nafissi, Raafat Mansour, Eihab M. Abdel-Rahman
Proc. ASME. IDETC-CIE2018, Volume 4: 23rd Design for Manufacturing and the Life Cycle Conference; 12th International Conference on Micro- and Nanosystems, V004T08A015, August 26–29, 2018
Paper No: DETC2018-86428
DOI: https://doi.org/10.1115/DETC2018-86428
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Topics: Microscopes, Probes, Atomic force microscopy, Actuators, Electrostatic actuators, Locks (Waterways), Printed circuit boards, Resonance, Separation (Technology), Signals
Proceedings Papers

On an Optimal Control Applied in Atomic Force Microscopy (AFM) Including Fractional-Order

Angelo M. Tusset, Jose M. Balthazar, Jeferson Jose de Lima, Rodrigo T. Rocha, Frederic C. Janzen, Patricia S. Yamaguchi
Proc. ASME. IDETC-CIE2017, Volume 4: 22nd Design for Manufacturing and the Life Cycle Conference; 11th International Conference on Micro- and Nanosystems, V004T09A003, August 6–9, 2017
Paper No: DETC2017-67536
DOI: https://doi.org/10.1115/DETC2017-67536
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Topics: Atomic force microscopy, Optimal control, Damping, Feedback, Dynamics (Mechanics), Microcantilevers, Nonlinear dynamics
Proceedings Papers

Electrical Impedance Matching of PZT NanoGenerators

Richard Galos, Yong Shi, Zhongjing Ren, Hao Sun
Proc. ASME. IDETC-CIE2017, Volume 4: 22nd Design for Manufacturing and the Life Cycle Conference; 11th International Conference on Micro- and Nanosystems, V004T09A025, August 6–9, 2017
Paper No: DETC2017-67981
DOI: https://doi.org/10.1115/DETC2017-67981
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Topics: Impedance (Electricity), Nanofibers, Atomic force microscopy, Electrospinning, Microscopy, Microwaves, Nanosensors, Stress
Proceedings Papers

Vision-Based Wayfinding Simulation of Digital Human Model in Three Dimensional as-is Environment Models and its Application to Accessibility Evaluation

Tsubasa Maruyama, Satoshi Kanai, Hiroaki Date
Proc. ASME. IDETC-CIE2016, Volume 1A: 36th Computers and Information in Engineering Conference, V01AT02A064, August 21–24, 2016
Paper No: DETC2016-59170
DOI: https://doi.org/10.1115/DETC2016-59170
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Topics: Simulation, Algorithms, Atomic force microscopy, Filters, Trajectories (Physics)
Proceedings Papers

Electrical Impedance Measurements of PZT Nanofiber Sensors

Richard Galos, Xin Li
Proc. ASME. IDETC-CIE2016, Volume 4: 21st Design for Manufacturing and the Life Cycle Conference; 10th International Conference on Micro- and Nanosystems, V004T08A004, August 21–24, 2016
Paper No: DETC2016-59687
DOI: https://doi.org/10.1115/DETC2016-59687
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Topics: Impedance (Electricity), Nanofibers, Sensors, Atomic force microscopy, Electrical resistivity, Electrospinning, Materials properties, Microfabrication, Microscopy, Nanosensors
Proceedings Papers

Nonlinear Phenomena in the Single-Mode Dynamics in an AFM Cantilever Beam

Laura Ruzziconi, Stefano Lenci, Mohammad I. Younis
Proc. ASME. IDETC-CIE2016, Volume 6: 12th International Conference on Multibody Systems, Nonlinear Dynamics, and Control, V006T09A040, August 21–24, 2016
Paper No: DETC2016-59571
DOI: https://doi.org/10.1115/DETC2016-59571
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Topics: Atomic force microscopy, Cantilever beams, Dynamics (Mechanics), Resonance, Separation (Technology), Attractors, Computer simulation, Safety, Cantilevers, Degrees of freedom
Proceedings Papers

Multi-Mode Q Control in Multifrequency Atomic Force Microscopy

Michael G. Ruppert, S. O. Reza Moheimani
Proc. ASME. IDETC-CIE2015, Volume 4: 20th Design for Manufacturing and the Life Cycle Conference; 9th International Conference on Micro- and Nanosystems, V004T09A009, August 2–5, 2015
Paper No: DETC2015-46989
DOI: https://doi.org/10.1115/DETC2015-46989
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Topics: Atomic force microscopy, Control equipment, Imaging, Q-factor, Actuators, Design methodology, Excitation, Feedback, Flexible structures, Materials properties
Proceedings Papers

Proper Orthogonal Decomposition of Tapping Microcantilevers in Liquid Atomic Force Microscopy

Il Kwang Kim, Soo Il Lee
Proc. ASME. IDETC-CIE2015, Volume 4: 20th Design for Manufacturing and the Life Cycle Conference; 9th International Conference on Micro- and Nanosystems, V004T09A035, August 2–5, 2015
Paper No: DETC2015-47234
DOI: https://doi.org/10.1115/DETC2015-47234
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Topics: Atomic force microscopy, Microcantilevers, Principal component analysis, Elastic moduli, Noise (Sound), Resonance, Stiffness
Proceedings Papers

Flexoelectric Actuation and Vibration Control of Ring Shells

Bolei Deng, Huiyu Li, Hornsen Tzou
Proc. ASME. IDETC-CIE2015, Volume 8: 27th Conference on Mechanical Vibration and Noise, V008T13A010, August 2–5, 2015
Paper No: DETC2015-47994
DOI: https://doi.org/10.1115/DETC2015-47994
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Topics: Shells, Vibration control, Atomic force microscopy, Electric fields, Stress, Actuators, Membranes, Probes, Vibration, Dynamic response
Proceedings Papers

Energy and Resource Efficiency in the Abrasive Flow Machining Process: An Assessment of Environmental and Economic Viability Within a UK Precision Machining SME

Mitchell J. Howard, Kai Cheng
Proc. ASME. IDETC-CIE2014, Volume 4: 19th Design for Manufacturing and the Life Cycle Conference; 8th International Conference on Micro- and Nanosystems, V004T06A051, August 17–20, 2014
Paper No: DETC2014-34110
DOI: https://doi.org/10.1115/DETC2014-34110
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Topics: Flow (Dynamics), Machining, Atomic force microscopy, Machinery, Manufacturing, Sustainability, Deburring, Design, Energy consumption, Finishing