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Proceedings Papers

Empirical Mode Decomposition for Dynamic AFM Microcantilevers in Air and Liquid Environment

Il Kwang Kim, Jea Woong Jang, Soo Il Lee
Proc. ASME. IDETC-CIE2018, Volume 4: 23rd Design for Manufacturing and the Life Cycle Conference; 12th International Conference on Micro- and Nanosystems, V004T08A012, August 26–29, 2018
Publisher: American Society of Mechanical Engineers
Paper No: DETC2018-86215
https://doi.org/10.1115/DETC2018-86215
View Paper titled, Empirical Mode Decomposition for Dynamic AFM Microcantilevers in Air and Liquid Environment
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Topics: Atomic force microscopy, Microcantilevers, Damping, Dynamics (Mechanics), Principal component analysis
Proceedings Papers

Torsional Tip Motion of Double Beam Atomic Force Microscopy

John O’Donnell, Anahita Zargarani, S. Nima Mahmoodi
Proc. ASME. IDETC-CIE2018, Volume 4: 23rd Design for Manufacturing and the Life Cycle Conference; 12th International Conference on Micro- and Nanosystems, V004T08A008, August 26–29, 2018
Publisher: American Society of Mechanical Engineers
Paper No: DETC2018-85411
https://doi.org/10.1115/DETC2018-85411
View Paper titled, Torsional Tip Motion of Double Beam Atomic Force Microscopy
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Topics: Atomic force microscopy, Boundary-value problems, Design, Galerkin method, Geometry, Piezoelectric actuators, Vibration
Proceedings Papers

Prototyping Electrostatic Scanning Force Microscope

Hamidreza Nafissi, Raafat Mansour, Eihab M. Abdel-Rahman
Proc. ASME. IDETC-CIE2018, Volume 4: 23rd Design for Manufacturing and the Life Cycle Conference; 12th International Conference on Micro- and Nanosystems, V004T08A015, August 26–29, 2018
Publisher: American Society of Mechanical Engineers
Paper No: DETC2018-86428
https://doi.org/10.1115/DETC2018-86428
View Paper titled, Prototyping Electrostatic Scanning Force Microscope
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Topics: Microscopes, Probes, Atomic force microscopy, Actuators, Electrostatic actuators, Locks (Waterways), Printed circuit boards, Resonance, Separation (Technology), Signals
Proceedings Papers

Stochastic Switching and Reduction of Integrity in Atomic Force Microscopy

Pierpaolo Belardinelli, Stefano Lenci, Farbod Alijani
Proc. ASME. IDETC-CIE2018, Volume 8: 30th Conference on Mechanical Vibration and Noise, V008T10A018, August 26–29, 2018
Publisher: American Society of Mechanical Engineers
Paper No: DETC2018-85421
https://doi.org/10.1115/DETC2018-85421
View Paper titled, Stochastic Switching and Reduction of Integrity in Atomic Force Microscopy
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Topics: Atomic force microscopy, Noise (Sound), Stability, Dynamics (Mechanics), Erosion, Excitation, Imaging, Probes, Resonance, Spectroscopy
Proceedings Papers

Electrical Impedance Matching of PZT NanoGenerators

Richard Galos, Yong Shi, Zhongjing Ren, Hao Sun
Proc. ASME. IDETC-CIE2017, Volume 4: 22nd Design for Manufacturing and the Life Cycle Conference; 11th International Conference on Micro- and Nanosystems, V004T09A025, August 6–9, 2017
Publisher: American Society of Mechanical Engineers
Paper No: DETC2017-67981
https://doi.org/10.1115/DETC2017-67981
View Paper titled, Electrical Impedance Matching of PZT NanoGenerators
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Topics: Impedance (Electricity), Nanofibers, Atomic force microscopy, Electrospinning, Microscopy, Microwaves, Nanosensors, Stress
Proceedings Papers

On an Optimal Control Applied in Atomic Force Microscopy (AFM) Including Fractional-Order

Angelo M. Tusset, Jose M. Balthazar, Jeferson Jose de Lima, Rodrigo T. Rocha, Frederic C. Janzen, Patricia S. Yamaguchi
Proc. ASME. IDETC-CIE2017, Volume 4: 22nd Design for Manufacturing and the Life Cycle Conference; 11th International Conference on Micro- and Nanosystems, V004T09A003, August 6–9, 2017
Publisher: American Society of Mechanical Engineers
Paper No: DETC2017-67536
https://doi.org/10.1115/DETC2017-67536
View Paper titled, On an Optimal Control Applied in Atomic Force Microscopy (AFM) Including Fractional-Order
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Topics: Atomic force microscopy, Optimal control, Damping, Feedback, Dynamics (Mechanics), Microcantilevers, Nonlinear dynamics
Proceedings Papers

Vision-Based Wayfinding Simulation of Digital Human Model in Three Dimensional as-is Environment Models and its Application to Accessibility Evaluation

Tsubasa Maruyama, Satoshi Kanai, Hiroaki Date
Proc. ASME. IDETC-CIE2016, Volume 1A: 36th Computers and Information in Engineering Conference, V01AT02A064, August 21–24, 2016
Publisher: American Society of Mechanical Engineers
Paper No: DETC2016-59170
https://doi.org/10.1115/DETC2016-59170
View Paper titled, Vision-Based Wayfinding Simulation of Digital Human Model in Three Dimensional as-is Environment Models and its Application to Accessibility Evaluation
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Topics: Simulation, Algorithms, Atomic force microscopy, Filters, Trajectories (Physics)
Proceedings Papers

Electrical Impedance Measurements of PZT Nanofiber Sensors

Richard Galos, Xin Li
Proc. ASME. IDETC-CIE2016, Volume 4: 21st Design for Manufacturing and the Life Cycle Conference; 10th International Conference on Micro- and Nanosystems, V004T08A004, August 21–24, 2016
Publisher: American Society of Mechanical Engineers
Paper No: DETC2016-59687
https://doi.org/10.1115/DETC2016-59687
View Paper titled, Electrical Impedance Measurements of PZT Nanofiber Sensors
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Topics: Impedance (Electricity), Nanofibers, Sensors, Atomic force microscopy, Electrical resistivity, Electrospinning, Materials properties, Microfabrication, Microscopy, Nanosensors
Proceedings Papers

Nonlinear Phenomena in the Single-Mode Dynamics in an AFM Cantilever Beam

Laura Ruzziconi, Stefano Lenci, Mohammad I. Younis
Proc. ASME. IDETC-CIE2016, Volume 6: 12th International Conference on Multibody Systems, Nonlinear Dynamics, and Control, V006T09A040, August 21–24, 2016
Publisher: American Society of Mechanical Engineers
Paper No: DETC2016-59571
https://doi.org/10.1115/DETC2016-59571
View Paper titled, Nonlinear Phenomena in the Single-Mode Dynamics in an AFM Cantilever Beam
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Topics: Atomic force microscopy, Cantilever beams, Dynamics (Mechanics), Resonance, Separation (Technology), Attractors, Computer simulation, Safety, Cantilevers, Degrees of freedom
Proceedings Papers

Flexoelectric Actuation and Vibration Control of Ring Shells

Bolei Deng, Huiyu Li, Hornsen Tzou
Proc. ASME. IDETC-CIE2015, Volume 8: 27th Conference on Mechanical Vibration and Noise, V008T13A010, August 2–5, 2015
Publisher: American Society of Mechanical Engineers
Paper No: DETC2015-47994
https://doi.org/10.1115/DETC2015-47994
View Paper titled, Flexoelectric Actuation and Vibration Control of Ring Shells
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Topics: Shells, Vibration control, Atomic force microscopy, Electric fields, Stress, Actuators, Membranes, Probes, Vibration, Dynamic response
Proceedings Papers

Multi-Mode Q Control in Multifrequency Atomic Force Microscopy

Michael G. Ruppert, S. O. Reza Moheimani
Proc. ASME. IDETC-CIE2015, Volume 4: 20th Design for Manufacturing and the Life Cycle Conference; 9th International Conference on Micro- and Nanosystems, V004T09A009, August 2–5, 2015
Publisher: American Society of Mechanical Engineers
Paper No: DETC2015-46989
https://doi.org/10.1115/DETC2015-46989
View Paper titled, Multi-Mode Q Control in Multifrequency Atomic Force Microscopy
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Topics: Atomic force microscopy, Control equipment, Imaging, Q-factor, Actuators, Design methodology, Excitation, Feedback, Flexible structures, Materials properties
Proceedings Papers

Proper Orthogonal Decomposition of Tapping Microcantilevers in Liquid Atomic Force Microscopy

Il Kwang Kim, Soo Il Lee
Proc. ASME. IDETC-CIE2015, Volume 4: 20th Design for Manufacturing and the Life Cycle Conference; 9th International Conference on Micro- and Nanosystems, V004T09A035, August 2–5, 2015
Publisher: American Society of Mechanical Engineers
Paper No: DETC2015-47234
https://doi.org/10.1115/DETC2015-47234
View Paper titled, Proper Orthogonal Decomposition of Tapping Microcantilevers in Liquid Atomic Force Microscopy
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Topics: Atomic force microscopy, Microcantilevers, Principal component analysis, Elastic moduli, Noise (Sound), Resonance, Stiffness
Proceedings Papers

Investigation of Dual-Frequency Excitation and the Influence of Excitation Phase on a Constrained Cantilevered Beam System

Wei Huang, Aaron M. Atzil, Andrew J. Dick
Proc. ASME. IDETC-CIE2014, Volume 4: 19th Design for Manufacturing and the Life Cycle Conference; 8th International Conference on Micro- and Nanosystems, V004T09A032, August 17–20, 2014
Publisher: American Society of Mechanical Engineers
Paper No: DETC2014-35479
https://doi.org/10.1115/DETC2014-35479
View Paper titled, Investigation of Dual-Frequency Excitation and the Influence of Excitation Phase on a Constrained Cantilevered Beam System
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Topics: Excitation, Atomic force microscopy, Cantilevers, Electromagnets, Experimental methods, Signals
Proceedings Papers

Eigenvalue Veering in Quartz Tuning Fork Sensors and its Effect on Dynamic Atomic Force Microscopy

John Melcher
Proc. ASME. IDETC-CIE2014, Volume 4: 19th Design for Manufacturing and the Life Cycle Conference; 8th International Conference on Micro- and Nanosystems, V004T09A033, August 17–20, 2014
Publisher: American Society of Mechanical Engineers
Paper No: DETC2014-35673
https://doi.org/10.1115/DETC2014-35673
View Paper titled, Eigenvalue Veering in Quartz Tuning Fork Sensors and its Effect on Dynamic Atomic Force Microscopy
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Topics: Atomic force microscopy, Eigenvalues, Quartz, Sensors, Errors, Resonance, Force measurement, Microcantilevers, Modeling, Q-factor
Proceedings Papers

Energy and Resource Efficiency in the Abrasive Flow Machining Process: An Assessment of Environmental and Economic Viability Within a UK Precision Machining SME

Mitchell J. Howard, Kai Cheng
Proc. ASME. IDETC-CIE2014, Volume 4: 19th Design for Manufacturing and the Life Cycle Conference; 8th International Conference on Micro- and Nanosystems, V004T06A051, August 17–20, 2014
Publisher: American Society of Mechanical Engineers
Paper No: DETC2014-34110
https://doi.org/10.1115/DETC2014-34110
View Paper titled, Energy and Resource Efficiency in the Abrasive Flow Machining Process: An Assessment of Environmental and Economic Viability Within a UK Precision Machining SME
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Topics: Flow (Dynamics), Machining, Atomic force microscopy, Machinery, Manufacturing, Sustainability, Deburring, Design, Energy consumption, Finishing
Proceedings Papers

Modeling Energy Dissipation in Atomic Force Microscopy

Wei Huang, Andrew J. Dick
Proc. ASME. IDETC-CIE2013, Volume 1: 15th International Conference on Advanced Vehicle Technologies; 10th International Conference on Design Education; 7th International Conference on Micro- and Nanosystems, V001T09A016, August 4–7, 2013
Publisher: American Society of Mechanical Engineers
Paper No: DETC2013-13448
https://doi.org/10.1115/DETC2013-13448
View Paper titled, Modeling Energy Dissipation in Atomic Force Microscopy
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Topics: Atomic force microscopy, Energy dissipation, Modeling, Computer simulation, Damping, Excitation, Nanoscale phenomena, Resolution (Optics), Resonance, Simulation results
Proceedings Papers

Characteristic Lengths and Distances: Fast and Robust Features for Nonlinear Time Series

Son Hai Nguyen, David Chelidze
Proc. ASME. IDETC-CIE2012, Volume 1: 24th Conference on Mechanical Vibration and Noise, Parts A and B, 615-621, August 12–15, 2012
Publisher: American Society of Mechanical Engineers
Paper No: DETC2012-71281
https://doi.org/10.1115/DETC2012-71281
View Paper titled, Characteristic Lengths and Distances: Fast and Robust Features for Nonlinear Time Series
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Topics: Time series, Atomic force microscopy, Dimensions, Dynamic systems, Engineering simulation, Ergodic theory, Fractals, Phase space, Simulation, Structural health monitoring
Proceedings Papers

Correlation of Atomic Force Microscopy Tapping Forces to Mechanical Properties of Lipid Membranes

Nicole Shamitko-Klingensmith, Kelley M. Wambaugh, Kathleen A. Burke, George J. Magnone, Justin Legleiter
Proc. ASME. IDETC-CIE2012, Volume 5: 6th International Conference on Micro- and Nanosystems; 17th Design for Manufacturing and the Life Cycle Conference, 303-310, August 12–15, 2012
Publisher: American Society of Mechanical Engineers
Paper No: DETC2012-70233
https://doi.org/10.1115/DETC2012-70233
View Paper titled, Correlation of Atomic Force Microscopy Tapping Forces to Mechanical Properties of Lipid Membranes
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Topics: Atomic force microscopy, Mechanical properties, Membranes, Cantilevers, Deflection, Imaging, Microscopy, Nanoscale phenomena, Physiology, Probes
Proceedings Papers

A Flexible Control System for Automated Atomic Force Microscope Based Micro-/Nanomanipulation

Florian Krohs, Sergej Fatikow
Proc. ASME. IDETC-CIE2012, Volume 5: 6th International Conference on Micro- and Nanosystems; 17th Design for Manufacturing and the Life Cycle Conference, 311-317, August 12–15, 2012
Publisher: American Society of Mechanical Engineers
Paper No: DETC2012-70304
https://doi.org/10.1115/DETC2012-70304
View Paper titled, A Flexible Control System for Automated Atomic Force Microscope Based Micro-/Nanomanipulation
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Topics: Atomic force microscopy, Control systems, Manufacturing, Nanoscale devices, Vacuum, Carbon nanotubes, Computer software, Control equipment, Design, Feedback
Proceedings Papers

Non-Linear Frequency Response of Atomic Force Microscope Cantilevers at the Solid-Liquid Interface

Daniel R. Kiracofe, Arvind Raman
Proc. ASME. IDETC-CIE2012, Volume 5: 6th International Conference on Micro- and Nanosystems; 17th Design for Manufacturing and the Life Cycle Conference, 319-328, August 12–15, 2012
Publisher: American Society of Mechanical Engineers
Paper No: DETC2012-70330
https://doi.org/10.1115/DETC2012-70330
View Paper titled, Non-Linear Frequency Response of Atomic Force Microscope Cantilevers at the Solid-Liquid Interface
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Topics: Atomic force microscopy, Cantilevers, Frequency response, Dynamics (Mechanics), Q-factor, Resonance, Computer simulation, Microcantilevers, Microscopy, Nonlinear dynamics